https://github.com/cran/spatstat
Tip revision: f7457087246bd256f747955fe499c99f02e18f0f authored by Adrian Baddeley on 26 May 2006, 00:00:00 UTC
version 1.9-1
version 1.9-1
Tip revision: f745708
DESCRIPTION
Package: spatstat
Version: 1.9-1
Date: 26 May 2006
Title: Spatial Point Pattern analysis, model-fitting, simulation, tests
Author: Adrian Baddeley <adrian@maths.uwa.edu.au> and
Rolf Turner <rolf@math.unb.ca>, with contributions by
Marie-Colette van Lieshout, Rasmus Waagepetersen and 17 others
Maintainer: Adrian Baddeley <adrian@maths.uwa.edu.au>
Depends: R (>= 2.2.0), mgcv
Suggests: sm
Description: A package for analysing spatial data,
mainly Spatial Point Patterns,
including multitype/marked points and spatial covariates,
in any two-dimensional spatial region.
Contains functions for exploratory data analysis,
model-fitting, simulation, model diagnostics,
and formal inference. Data types include point patterns,
line segment patterns, spatial windows, and
pixel images. Point process models can be
fitted to point pattern data. Cluster type models are fitted
by the method of minimum contrast. Very general Gibbs point
process models can be fitted to point pattern data
using a function ppm similar to lm or glm. Models may
include dependence on covariates, interpoint interaction
and dependence on marks. Fitted models can be simulated automatically.
Also provides facilities for formal inference (such as chi-squared
tests) and model diagnostics (including simulation
envelopes, residuals, residual plots and Q-Q plots).
License: GPL version 2 or newer
URL: http://www.spatstat.org
Packaged: Fri May 26 12:14:51 2006; adrian