https://github.com/cran/spatstat
Tip revision: cd674f37c3fcb1e480ff95e091708ec4ada60212 authored by Adrian Baddeley on 10 February 2011, 08:22:40 UTC
version 1.21-5
version 1.21-5
Tip revision: cd674f3
DESCRIPTION
Package: spatstat
Version: 1.21-5
Date: 2011-02-10
Title: Spatial Point Pattern analysis, model-fitting, simulation, tests
Author: Adrian Baddeley <Adrian.Baddeley@csiro.au> and Rolf Turner
<r.turner@auckland.ac.nz> with substantial contributions of
code by Kasper Klitgaard Berthelsen; Marie-Colette van
Lieshout; Dominic Schuhmacher; Ege Rubak; and Rasmus
Waagepetersen. Additional contributions by Q.W. Ang; S. Azaele;
C. Beale; R. Bernhardt; B. Biggerstaff; R. Bivand; F. Bonneu;
J. Burgos; S. Byers; Y.M. Chang; J.B. Chen; I. Chernayavsky;
Y.C. Chin; B. Christensen; M. de la Cruz; P. Dalgaard; P.J.
Diggle; I. Dryden; S. Eglen; A. Gault; M. Genton; P. Grabarnik;
C. Graf; J. Franklin; U. Hahn; A. Hardegen; M. Hering; M.B.
Hansen; M. Hazelton; J. Heikkinen; K. Hornik; R. Ihaka; R.
John-Chandran; D. Johnson; J. Laake; R. Mark; J. Mateu; P.
McCullagh; S. Meyer; X.C. Mi; J. Moller; L.S. Nielsen; F.
Nunes; E. Parilov; J. Picka; A. Raftery; M. Reiter; T.O.
Richardson; B.D. Ripley; B. Rowlingson; J. Rudge; A. Sarkka; K.
Schladitz; B.T. Scott; I.-M. Sintorn; Y. Song; M. Spiess; M.
Stevenson; M. Sumner; P. Surovy; B. Turlach; A. van Burgel; T.
Verbeke; A. Villers; H. Wang; H. Wendrock; J. Wild and S. Wong.
Maintainer: Adrian Baddeley <Adrian.Baddeley@csiro.au>
Depends: R (>= 2.10.0), stats, graphics, utils, mgcv, deldir (>=
0.0-10)
Suggests: gpclib, sm, maptools, rpanel, tkrplot, scatterplot3d
Description: A package for analysing spatial data, mainly Spatial Point
Patterns, including multitype/marked points and spatial
covariates, in any two-dimensional spatial region. Also
supports three-dimensional point patterns, and space-time point
patterns in any number of dimensions. Contains over 1000
functions for plotting spatial data, exploratory data analysis,
model-fitting, simulation, spatial sampling, model diagnostics,
and formal inference. Data types include point patterns, line
segment patterns, spatial windows, pixel images and
tessellations. Exploratory methods include K-functions, nearest
neighbour distance and empty space statistics, Fry plots, pair
correlation function, kernel smoothed intensity, relative risk
estimation with cross-validated bandwidth selection, mark
correlation functions, segregation indices, mark dependence
diagnostics etc. Point process models can be fitted to point
pattern data using functions ppm, kppm, slrm similar to glm.
Models may include dependence on covariates, interpoint
interaction, cluster formation and dependence on marks. Fitted
models can be simulated automatically. Also provides facilities
for formal inference (such as chi-squared tests) and model
diagnostics (including simulation envelopes, residuals,
residual plots and Q-Q plots).
License: GPL (>= 2)
URL: http://www.spatstat.org
Packaged: 2011-02-10 05:38:20 UTC; adrian
Repository: CRAN
Date/Publication: 2011-02-10 08:22:40