Revision fd3e237533b3d39efabdf8ed57effe41a61458dc authored by Max Turner on 22 July 2016, 23:32:57 UTC, committed by Max Turner on 22 July 2016, 23:32:57 UTC
Added options to select pre-processed image patch locations for +/- contrast images and to either randomly sample images or span based on subunit-LN model differences. Affects Linear equivalent disc, linear equivalent annulus, and mean + contrast image
1 parent 7fb02aa
| File | Mode | Size |
|---|---|---|
| +edu | ||
| .gitignore | -rw-r--r-- | 93 bytes |
| LICENSE | -rw-r--r-- | 1.0 KB |
| README.md | -rw-r--r-- | 66 bytes |
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